worst case test
Computational Intelligence Characterization Method of Semiconductor Device
Liau, Eric, Schmitt-Landsiedel, Doris
Characterization of semiconductor devices is used to gather as much data about the device as possible to determine weaknesses in design or trends in the manufacturing process. In this paper, we propose a novel multiple trip point characterization concept to overcome the constraint of single trip point concept in device characterization phase. In addition, we use computational intelligence techniques (e.g.